Structural paradigm of Se-rich Ge–Se glasses by high-resolution x-ray photoelectron spectroscopy

R. Golovchak, O. Shpotyuk, S. Kozyukhin, A. Kovalskiy, A. Miller, and H. Jain.

Journal of Applied Physics, vol. 105, 2009, p. 103704.

Abstract

The structure of binary GexSe100−x chalcogenide glass family (0 ≤ x ≤ 30) is determined by high-resolution x-ray photoelectron spectroscopy XPS. On the basis of compositional dependences of fitting parameters for Ge and Se core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. We find that this ratio for glasses with 20 ≤ x ≤ 30 is almost constant with a value same as for the high-temperature crystalline form of GeSe2.

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