Structural paradigm of Se-rich Ge–Se glasses by high-resolution x-ray photoelectron spectroscopy

R. Golovchak, O. Shpotyuk, S. Kozyukhin, A. Kovalskiy, A. Miller, and H. Jain.

Journal of Applied Physics, vol. 105, 2009, p. 103704.


The structure of binary GexSe100−x chalcogenide glass family (0 ≤ x ≤ 30) is determined by high-resolution x-ray photoelectron spectroscopy XPS. On the basis of compositional dependences of fitting parameters for Ge and Se core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. We find that this ratio for glasses with 20 ≤ x ≤ 30 is almost constant with a value same as for the high-temperature crystalline form of GeSe2.


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