T. Kavetskyy, O. Shpotyuk, I. Kaban, and W. Hoyer.
The journal of chemmical physics, vol. 128, 2008, p. 44514.
Atomic structures of Ge25Sb15S60 and Ge35Sb5S60 glasses are investigated in the γ-irradiated and annealed after γ-irradiation states by means of high-energy synchrotron x-ray diffraction technique. The first sharp diffraction peak FSDP is detected at around 1.1 Å−1 in the structure factors of both alloys studied. The FSDP position is found to be stable for radiation/annealing treatment of the samples, while the FSDP intensity shows some changes between -irradiated and annealed states. The peaks in the pair distribution functions observed between 2 and 4 Å are related to the Ge–S, Ge–Sb, and Sb–Sb first neighbour correlations and Ge–Ge second neighbour correlations in the edge-shared GeS4/2 tetrahedra, and S–S and/or Ge–Ge second neighbour correlations in the corner-shared GeS4/2 tetrahedra. Three mechanisms of the radiation-/annealing-induced changes are discussed in the framework of coordination topological defect formation and bond-free solid angle concepts.