On the analytical description of ageing kinetics in ceramic manganite-based NTC thermistors

V. Balitska, B. Butkievich, O. Shpotyuk, M. Vakiv.

Microelectronics Reliability, vol. 42, 2002, p. 2003–2007.


Experimental results on thermally induced degradation tests carried out at the relatively low ageing temperatures less than 200º C in NTC ceramic thermistors based on mixed transition-metal manganites (Cu,Ni,Co,Mn)3O4 are discussed. It is first established that, despite of chemical composition and technological features of the investigated ceramics, the stretched-exponential relaxation function of DeBast–Gillard or Williams–Watts is the unique analytical expression describing kinetics of the observed degradation processes.


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