V. Balitska, B. Butkievich, O. Shpotyuk, M. Vakiv.
Microelectronics Reliability, vol. 42, 2002, p. 2003–2007.
Experimental results on thermally induced degradation tests carried out at the relatively low ageing temperatures less than 200º C in NTC ceramic thermistors based on mixed transition-metal manganites (Cu,Ni,Co,Mn)3O4 are discussed. It is first established that, despite of chemical composition and technological features of the investigated ceramics, the stretched-exponential relaxation function of DeBast–Gillard or Williams–Watts is the unique analytical expression describing kinetics of the observed degradation processes.