Computer program PARAV for calculating optical constants of thin films and bulk materials: Case study of amorphous semiconductors

A. Ganjoo, R. Golovchak.

Journal of optoelectronics and advanced materials, vol. 10, No. 6, 2008, p. 1328-1332.

Abstract

A computer program “PARAV” for calculating various optical constants, e.g., the dispersion of refractive index, optical absorption coefficient, optical thickness and optical bandgap, from experimentally measured transmission spectra of bulk materials and thin films is developed. User-friendly interface, convenient input and output of the measured and calculated data in the form of text files are also a feature of this software. Data from amorphous semiconductors (chalcogenide glasses and thin films and a-Si:H) are used as typical examples to check the reliability of the program.

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